flying probe tester for chip components

Industrial control & Automatic Testing

Flying Probe Tester for Chip Components

Overview

This tester was designed to measure passive chip components such as chip resistors, chip capacitors and chip inductances on the base board before cutting.
Resistor arrays, & resistor networks are also measurable on this tester.
The location pattern of sampling points is user definable, to deal with variations of product specifications. The definition can be done either by filling the fields of the table or by teaching on the board map. It is friendly, and requires very little training time.
Precision motion mechanism is used for positioning control, comprizes four axis of X1, Y2, X2, Y2 and two independently controlled probes.
positioning resolution: 0.01mm(higher resolution can be provided per customer's requirements)
stroke:150mm * 150mm (per customer's requirements)
PC connects the DMM via comunication interfaces such as GPIB/RS-232/RS-485 to acquire the measurement data.
PC collects the measured data from DMM for analyzation and generation of SPC charts and reports.

The dimensions of the board including the pitch of cells may be saved for easy retrieval.
This automatic tester makes the inspection work accurate and fast.
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LAFA^TEC Inc.
Tel:+886-6-592-1792
Fax:+886-6-592-1796

Industrial control & Automatic Testing
http://www.LFT.com.tw
E-Mail: Please use contact form.